Generating Basis Siphons and Traps of Petri Nets Using the Sign Incidence Matrix1

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 41, Issue 4, 1994, Pages 266-271

  Boer, Erwin R ^a   Murata, Tadao ^b  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SYSTEM RECOVERY; LOGIC PROGRAMMING; MATRIX ALGEBRA; MINIMIZATION OF SWITCHING NETS; SET THEORY; STATE ASSIGNMENT;

BASIS SIPHONS; SIGN INCIDENCE MATRIX; SIPHONS; TRAPS;

PETRI NETS;

EID: 0028419265     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/81.285680     Document Type: Article

References (7)

1. J. Ezpeleta and J. M. Couvreur, “A new technique for finding a generating family of siphons, traps and st-components, application to colored Petri nets,” in Procs. 12 th Int. Conf. on Appl. and Theory of Petri Nets,, 1991.
2. M. Kinuyama and T. Murata, “Generating siphons and traps by Petri net representation of logic equations,” in Procs. 2nd Conf. of the Net Theory SIG-IEICE „ 1986.
3. K. Lautenbach, “Linear algebraic calculation of deadlocks and traps,” in Concurrency and Nets—Advances in Petri Nets, Voss, Genrich, Rozenberg, Eds., New York: Springer-Verlag, 1987, pp. 315–336.
4. K. Lautenbach, “The reproducibility of the empty marking in place/transition nets,” unpublished manuscript, Computer Science Department, University Koblenz-Landau, Koblenz, Germany, 1993.
5. T. Matsumoto and K. Tsuji, “The initial-marking-based necessary and sufficient condition for liveness of a subclass of general Petri nets—Part II—Nets with new behavioral traps,” submitted for publication, 1992.
6. T. Murata, “Petri nets: properties, analysis and applications,” in Procs. IEEE, vol. 77, no. 4, 1989, pp. 541–580.
7. T. Shimura, J. Lobo, and T. Murata, “A Petri net semantics for logic programs with negation,” in Procs. 1992 Int. Conf. on Software Eng. and Knowledge Eng., 1992 (an extended version is to appear in the IEEE Transactions on Knowledge and Data Engineering).