JFET-CMOS process to meet the requirements of tracking applications at short processing times

Nuclear Inst. and Methods in Physics Research, A

Volumn 344, Issue 1, 1994, Pages 166-172

  Cesura, G ^a,b   Manfredi, P F ^a,b   Re, V ^a,b   Speziali, V ^a,b  

^a UNIVERSITY OF PAVIA   (Italy)

^b INFN SEZIONE DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COLLIDING BEAM ACCELERATORS; ELEMENTARY PARTICLES; FIELD EFFECT TRANSISTORS; PARTICLE BEAM TRACKING; PARTICLE BEAMS; RADIATION HARDENING; SILICON ON INSULATOR TECHNOLOGY; SPURIOUS SIGNAL NOISE;

CHARGE SENSITIVE PREAMPLIFIERS; HIGH LUMINOSITY COLLIDERS; LARGE HADRON COLLIDERS (LHC); MICROSTRIP DETECTORS; MICROVERTEX DETECTORS; RADIATION TOLERANCE;

PARTICLE DETECTORS;

EID: 0028416228     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(94)90666-1     Document Type: Article

References (12)

1. Proc 3rd Int Conf on Advanced Technology and Particle Physics
2. Proc. 3rd Int. Conf. on Advanced Technology and Particle Physics