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Applied Physics Letters

Volumn 64, Issue 15, 1994, Pages 1983-1985

Correlation between photoluminescence and surface species in porous silicon: Low-temperature annealing

(2) Tsybeskov, L a Fauchet, P M a

a UNIVERSITY OF ROCHESTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION EFFECTS; FOURIER TRANSFORMS; HYDROGEN; INFRARED SPECTROSCOPY; LOW TEMPERATURE OPERATIONS; MORPHOLOGY; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; POROUS MATERIALS; SURFACES; THERMAL EFFECTS;

ATOMIC FORCE MICROSCOPE; CHEMICAL BOND; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT EMITTING POROUS SILICON; SURFACE CHEMISTRY;

SILICON;

EID: 0028405636 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.111714 Document Type: Article

Times cited : (110)

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