Acceptance Sampling: An Efficient, Accurate Method for Estimating and Optimizing Parametric Yield

IEEE Journal of Solid-State Circuits

Volumn 29, Issue 3, 1994, Pages 323-327

  Elias, Norman J ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; MONTE CARLO METHODS; OPTIMIZATION;

ACCEPTANCE SAMPLING; PARAMETRIC YIELD; SEARCH ALGORITHMS;

INTEGRATED CIRCUITS;

EID: 0028385333     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.278356     Document Type: Article

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