Measurements of dielectric constants and surface resistance for millimeter and submillimeter wavelength region using Josephson effect

Electronics and Communications in Japan (Part II: Electronics)

Volumn 77, Issue 3, 1994, Pages 74-82

  Kawakami, Akira ^a   Wang, Zhen ^a   Komiyama, Bokuji ^a  

^a Ministry of Posts and Telecommunications   (Japan)

Author keywords

dielectric constant; Josephson effect; Microstrip; resonator; surface resistance

Indexed keywords

DIELECTRIC FILMS; DIELECTRIC PROPERTIES; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTRIC RESISTANCE MEASUREMENT; MICROSTRIP DEVICES; MICROWAVE MEASUREMENT; MILLIMETER WAVES; RESONATORS; SURFACE PROPERTIES; THIN FILMS;

DIELECTRIC CONSTANTS; JOSEPHSON EFFECT; MILLIMETER WAVELENGTH; SUBMILLIMETER WAVELENGTH; SURFACE RESISTANCE;

JOSEPHSON JUNCTION DEVICES;

EID: 0028383643     PISSN: 8756663X     EISSN: 15206432     Source Type: Journal    
DOI: 10.1002/ecjb.4420770309     Document Type: Article

References (18)

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