The allowable spacing for lattice data sampling by a round stylus tip and an assessment of the envelope surface

International Journal of Machine Tools and Manufacture

Volumn 35, Issue 2, 1995, Pages 183-186

  Yanagi, Kazuhisa ^a   Kobayashi, Naoki ^a   Kasahara, Kazufumi ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA PROCESSING; MACHINING; PERSONAL COMPUTERS; SAMPLING; SURFACE WAVES; TEXTURES; THREE DIMENSIONAL;

HEIGHT DATA POINTS; LATTICE DATA SAMPLING; MACROSCOPIC WAVINESS CURVE; SURFACE ROUGHNESS; SURFACE WAVINESS ASSESSMENT; THREE DIMENSIONAL STYLUS INSTRUMENT; WIRE ELECTRIC DISCHARGE;

SURFACE MEASUREMENT;

EID: 0028383091     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/0890-6955(94)P2371-L     Document Type: Article

References (3)

1. Effect of Stylus Radius on the Roughness Values Measured with Tracing Stylus Instruments
2. Algorithms to Deconvolve Stylus Geometry from Surface Profile Measurements
3. An Optimum Sampling Interval for Digitizing Surface Asperity Profiles