Hot carrier effects in devices and circuits formed from poly-Si

IEE Proceedings: Circuits, Devices and Systems

Volumn 141, Issue 1, 1994, Pages 38-44

  Ayres, J R ^a   Young, N D ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CHARGE CARRIERS; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; LIQUID CRYSTAL DISPLAYS;

CARRIER TRAPPING; GATE BIAS; HOT CARRIER EFFECTS; IONIC INSTABILITY; MOBILE ION EFFECTS;

THIN FILM DEVICES;

EID: 0028380478     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:19949951     Document Type: Article

References (20)