Atomic Force Microscopy: Imaging with Electrical Double Layer Interactions

Langmuir

Volumn 10, Issue 2, 1994, Pages 358-362

  Senden, Tim J ^a,b   Drummond, Calum J ^a,b   Kékicheff, Patrick ^a,b  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

HYDRATION; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; SOLUTIONS; SURFACE PHENOMENA;

ATOMIC FORCE MICROSCOPY; BORN CONTACT IMAGING; ELECTRICAL DOUBLE LAYER; SURFACE IMAGES; TIP SAMPLE SURFACE FORCES;

ELECTROLYTES;

EID: 0028378151     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la00014a004     Document Type: Article

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