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Volumn 21, Issue 2, 1994, Pages 87-94

Quantification of SIMS data for multicomponent glasses

Author keywords

[No Author keywords available]

Indexed keywords

FRACTURE; OXIDES; SPECTROMETERS; SURFACES;

EID: 0028370259     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.740210205     Document Type: Article
Times cited : (8)

References (23)
  • 9
    • 84989062914 scopus 로고
    • Proc. 12th Annual Conf. of the Microbeam Analysis Society, Boston, p.
    • (1977) , pp. 140A
    • Newbury, D.E.1
  • 10
    • 84989127575 scopus 로고
    • Proc. 23th Annual Conf. of the Microbeam Analysis Society, Ann Arbor, p.
    • (1978) , pp. 6A
    • Newbury, D.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.