Direct observation of microscopic inhomogeneities with energy-dispersive diffraction of synchrotron-produced X-rays

Science

Volumn 263, Issue 5152, 1994, Pages 1416-1418

  Skelton, E F ^a   Drews, A R ^a   Osofsky, M S ^a   Qadri, S B ^a   Hu, J Z ^b   Vanderah, T A ^c,e   Peng, J L ^d   Greene, R L ^d  

^a NAVAL RESEARCH LABORATORY   (United States)

^b GEOPHYSICAL LABORATORY   (United States)

^c NAVAL AIR WARFARE CENTER   (United States)

^d UNIVERSITY OF MARYLAND   (United States)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0028335039     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.263.5152.1416     Document Type: Article

References (11)

1. T. A. Vanderah et al., J. Cryst. Growth 118, 385 (1992).
2. J. Giapintzakis, D. M. Ginsberg, P.-D. Han, J. Low Temp. Phys. 77, 155 (1989).
3. W. Sadowski et al., J. Less-Common Met. 164, 165, 824 (1990).
4. R. J. Cava et al., Phys. C 199, 65 (1992). In this paper, a variation of the diffraction angle for the (006) peak with Ce content is reported on the basis of data taken with monochromatic x-rays (wavelength λ = 1.19996 Å). However, the resulting c axis length is inconsistent with the accepted value. After private discussions with one of the authors, it was agreed that an alternate wavelength calibration (λ = 1.20526 Å) may be appropriate.
5. A. R. Drews et al., Phys. C 200, 122 (1992).
6. J. L. Peng, Z. Y. Li, R. L. Greene, ibid. 177, 79 (1991).
7. H. Takagi, S. Uchida, Y. Tokura, Phys. Rev. Lett. 62, 1197 (1989).
8. W. N. Hardy, D. A. Bonn, D. C. Morgan, R. Liang, K. Zhang ibid. 70, 3999 (1993).
9. S. M. Anlage et al., in preparation.
10. Q. Huang et al., Nature 347, 369 (1990).
11. 4-y crystals.