Flash EPROM disturb mechanisms

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1994, Pages 299-308

  Dunn, Clyde ^a   Kaya, Cetin ^a   Lewis, Terry ^a   Strauss, Tim ^a   Schreck, John ^a   Hefley, Pat ^a   Middendorf, Matt ^a   San, Tamer ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DIELECTRIC DEVICES; ELECTRIC FIELD EFFECTS; FAILURE ANALYSIS; GATES (TRANSISTOR); MATHEMATICAL MODELS; MOS DEVICES; SEMICONDUCTOR STORAGE; THERMAL EFFECTS; TRANSISTORS;

FLASH EPROM; FLOATING GATE AVALANCHE INJECTION MOS TRANSISTORS; HOLE INJECTION; TUNNEL DIELECTRIC; WRITE/ERASE CYCLING;

PROM;

EID: 0028312527     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1994.307820     Document Type: Conference Paper

References (16)