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Volumn , Issue , 1994, Pages 108-113
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Pragmatic test and diagnosis methodology for partially testable MCMs
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FAULT CURRENTS;
ELECTRIC FAULT LOCATION;
ELECTRIC NETWORK PARAMETERS;
INTEGRATED CIRCUIT TESTING;
MICROPROCESSOR CHIPS;
NETWORK COMPONENTS;
PRINTED CIRCUIT BOARDS;
SUBSTRATES;
BARE DIE TESTING;
FINAL MODULE TESTING;
PARTIALLY TESTABLE MULTICHIP MODULES;
PRAGMATIC TEST AND DIAGNOSIS METHODOLOGY;
SUBSTRATE TESTING;
ELECTRONICS PACKAGING;
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EID: 0028288761
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (12)
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References (27)
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