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Volumn , Issue , 1994, Pages 108-113

Pragmatic test and diagnosis methodology for partially testable MCMs

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; ELECTRIC FAULT LOCATION; ELECTRIC NETWORK PARAMETERS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; NETWORK COMPONENTS; PRINTED CIRCUIT BOARDS; SUBSTRATES;

EID: 0028288761     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (12)

References (27)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.