Circuit Analysis and Optimization Driven by Worst-Case Distances

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 13, Issue 1, 1994, Pages 57-71

  Antreich, Kurt J ^a   Graeb, Helmut E ^a   Wieser, Claudia U ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTATIONAL METHODS; ELECTRIC NETWORK PARAMETERS; ELECTRIC NETWORK SYNTHESIS; FITS AND TOLERANCES; GEOMETRY; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; MONTE CARLO METHODS; NUMERICAL METHODS; OPTIMIZATION; ROBUSTNESS (CONTROL SYSTEMS);

DESIGN CENTERING; DESIGN VARIABLES; DETERMINISTIC METHOD; PARAMETRIC CIRCUIT DESIGN; STANDARD CIRCUIT SIMULATORS; WORSE CASE TRANSISTOR MODEL PARAMETERS; WORST CASE DISTANCES;

COMPUTER AIDED NETWORK ANALYSIS;

EID: 0028256775     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.273749     Document Type: Article

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