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Volumn 129, Issue 2-3, 1994, Pages 415-422
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Microstructural characterization of Co/Cu multilayers
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
COBALT;
COPPER;
ELECTRIC RESISTANCE;
GRAIN BOUNDARIES;
MAGNETIC FIELD EFFECTS;
MAGNETIC FILMS;
MAGNETIC PROPERTIES;
MICROSCOPIC EXAMINATION;
MICROSTRUCTURE;
PHASE TRANSITIONS;
SPUTTERING;
COBALT/COPPER MULTILAYERS;
MAGNETORESISTANCE;
METALLIC SUPERLATTICES;
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EID: 0028195958
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/0304-8853(94)90140-6 Document Type: Article |
Times cited : (21)
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References (30)
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