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Volumn , Issue , 1994, Pages 286-291
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Photon emission study of ESD protection devices under second breakdown conditions
a
a
HITACHI LTD
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
CORRELATION METHODS;
ELECTRIC BREAKDOWN;
ELECTRIC CURRENTS;
ELECTRIC DISCHARGES;
ELECTROSTATICS;
PERFORMANCE;
PHOTONS;
PROTECTION;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR JUNCTIONS;
CURRENT DRIVEABILITY;
DRAIN STRUCTURES;
ELECTROSTATIC DISCHARGE PROTECTION;
PHOTON EMISSION;
MOSFET DEVICES;
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EID: 0028195446
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/relphy.1994.307822 Document Type: Conference Paper |
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Times cited : (9)
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References (5)
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