Comparison of ESD protection capability of SOI and BULK CMOS output buffers

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1994, Pages 292-298

  Chan, Mansun ^a   Yuen, Selina S ^a   Ma, Zhi Jian ^a   Hui, Kelvin Y ^a   Ko, Ping K ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER CIRCUITS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTROMAGNETIC COMPATIBILITY; ELECTROSTATICS; HUMAN FORM MODELS; INTEGRATED CIRCUIT LAYOUT; MOSFET DEVICES; OVERCURRENT PROTECTION; PROTECTION; RELIABILITY; SILICON ON INSULATOR TECHNOLOGY;

ELECTROSTATIC DISCHARGE PROTECTION; HUMAN BODY MODEL STRESSES; NMOS OUTPUT BUFFERS;

CMOS INTEGRATED CIRCUITS;

EID: 0028194336     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)