Measurement and tridimensional simulation of silicon pixel detector capacitance

IEEE Nuclear Science Symposium & Medical Imaging Conference

Volumn , Issue pt 1, 1994, Pages 338-342

  Bosisio, Luciano ^a   Forti, Francesco ^a   Tomacruz, Eric ^a  

^a UNIVERSITY OF TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CAPACITANCE MEASUREMENT; CODES (SYMBOLS); COMPUTER SIMULATION; CROSSTALK; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SIGNAL THEORY; THREE DIMENSIONAL;

CHARGE PARTITIONING METHOD; PIXEL STRUCTURE; PREAMPLIFIER MATCHING; SIGNAL RESPONSE; SILICON PIXEL DETECTORS; TRACKING DEVICES; TRIDIMENSIONAL SIMULATION;

SILICON SENSORS;

CHARGE PARTITIONING METHOD; PIXEL STRUCTURE; PREAMPLIFIER MATCHING; SIGNAL RESPONSE; SILICON PIXEL DETECTORS; TRACKING DEVICES; TRIDIMENSIONAL SIMULATION;

EID: 0028184817     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)