BIST test pattern generators for stuck-open and delay testing

Proceedings of the European Design and Test Conference

Volumn , Issue , 1994, Pages 289-296

  Chen, Chih Ang ^a   Gupta, Sandeep K ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; COMPUTER CIRCUITS; CONSTRAINT THEORY; FINITE AUTOMATA; MATHEMATICAL MODELS; SHIFT REGISTERS; STATE ASSIGNMENT; VECTORS; VLSI CIRCUITS;

BUILT IN SELF TESTS; CELLULAR AUTOMATA; DELAY TESTING; INITIALIZATION VECTORS; LINEAR FEEDBACK SHIFT REGISTERS; STUCK OPEN; TEST PATTERN GENERATORS; TEST VECTOR; TWO PATTERN TESTS;

INTEGRATED CIRCUIT TESTING;

EID: 0028135829     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)