Integrated time reference

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 1994, Pages 56-57

  Blauschild, Robert A ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPARATOR CIRCUITS; ELECTRIC PROPERTIES; MATHEMATICAL MODELS; SCHEMATIC DIAGRAMS;

INTEGRATED TIME CONSTANT; TIME REFERENCES; TIME STANDARD;

INTEGRATED CIRCUITS;

EID: 0028126172     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)