Microtribology of Magnetic Media

Proceedings of the Institution of Mechanical Engineers, Part J: Journal of Engineering Tribology

Volumn 208, Issue 1, 1994, Pages 17-29

  Bhushan, B ^a   Koinkar, V N ^a   Ruan, j a ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INSTRUMENTATION; MAGNETIC RECORDING; MAGNETIC TAPES; TRIBOLOGY;

EID: 0028103025     PISSN: 13506501     EISSN: 2041305X     Source Type: Journal    
DOI: 10.1243/PIME_PROC_1994_208_346_02     Document Type: Review

References (49)

1. Binnig G. Rohrer H. Gerber Ch. Weibel E. Surface studies by scanning tunneling microscopy. Phys. Rev. Lett., 1982, 49(1), 57-61.
2. Melmed A. J. The art and science and other aspects of making sharp tips. J. Vac. Sci. Technol. B, 1991, 9(2), 601-608.
3. Binnig G. Quate C. F. Gerber Ch. Atomic force microscope. Phys. Rev. Lett., 1986, 56(9), 930-933.
4. Israelachvili J. N. Adams G. E. Measurement of friction between two mica surfaces in aqueous electrolyte solutions in the range 0-100 nm. Chem. Soc. J., Faraday Trans. I, 1978, 74, 975-1001.
5. Israelachvili J. N. McGuiggan P. M. Homola A. M. Dynamic properties of molecularly thin liquid films. Science, 1988, 240, 189-190.
6. Van Alsten J. Granick S. Molecular tribology of ultrathin liquid films. Phys. Rev. Lett., 1988, 61(22), 2570-2573.
7. Granick S. Motions and relaxations of confined liquids. Science, 1991, 253, 1374-1379.
8. Albrecht T. R. Akamine S. Carver T. E. Quate C. F. Microfabrication of cantilever styli for the atomic force microscope. J. Vac. Sci. Technol. A, 1990, 8(4), 3386-3396.
9. McClelland G. M. Erlandsson R. Chiang S. Atomic force microscopy: General principles and a new implementation. In Review of progress in quantitative nondestructive evaluation (Eds Thompson D. O. Chimenti D. E. ), Vol. 6B, 1987, pp. 1307-1314 (Plenum Press, New York
10. Mate C. M. McClelland G. M. Erlandsson R. Chiang S. Atomic-scale friction of a tungsten tip on a graphite surface. Phys. Rev. Lett., 1987, 59(17), 1942-1945.
11. Erlandsson R. McClelland G. M. Mate C. M. Chiang S. Atomic force microscopy using optical interferometry. J. Vac. Sci. Technol. A, 1988, 6(2), 266-270.
12. Martin Y. Williams C. C. Wickramasinghe H. K. Atomic force microscope舒force mapping and profiling on a sub 100-Ɨ scale. J. Appl. Phys., 1987, 61(10), 4723-4729.
13. Albrecht T. R. Quate C. F. Atomic resolution imaging of a nonconductor by atomic force microscopy. J. Appl. Phys., 1987, 62(7), 2599-2602.
14. Marti O. Drake B. Hansma P. K. Atomic force microscopy of liquid-covered surfaces: Atomic resolution images. Appl. Phys. Lett., 1987, 51(7), 484-486.
15. Meyer G. Amer N. M. Optical-beam-deflection atomic force microscopy: The NaCl (001) surface. Appl. Phys. Lett., 1990, 56(21), 2100-2101.
16. Maivald P. Butt H. J. Gould S. A. C. Prater C. B. Drake B. Gurley J. A. Elings V. B. Hansma P. K. Using force modulation to image surface elasticities with the atomic force microscope. Nanotechnology, 1991, 2(2), 103-106.
17. Radmacher M. Tillman R. W. Fritz M. Gaub H. E. From molecules to cells舒imaging soft samples with the atomic force microscope. Science, 1992, 257, 1900-1905.
18. Bhushan B. Tribology and mechanics of magnetic storage devices, 1990, Springer-Verlag, New York
19. Bhushan B. Blackman G. S. Atomic force microscopy of magnetic rigid disks and sliders and its applications to tribology. Trans. ASME, J. Trib., 1991, 113, 452-458.
20. Oden P. I. Majumdar A. Bhushan B. Padmanabhan A. Graham J. J. AFM imaging, roughness analysis and contact mechanics of magnetic tape and head surfaces. Trans. ASME, J. Trib., 1992, 114, 666-674.
21. Kaneko R. Enomoto Y. Proceedings of First International Workshop on Microtribology, October 1992 (The Japanese Society of Tribologists, Tokyo, Japan
22. Martin Y. Wickramasinghe H. K. Magnetic imaging by force microscopy with 1000 Ɨ resolution. Appl. Phys. Lett., 1987, 50(20), 1455-1457.
23. Schonenberger C. Alvarado S. F. Understanding magnetic force microscopy. Z. Phys. B. (Germany), 1990, 80(3), 373-383.
24. Grɒtter P. Rugar D. Mamin H. J. Castillo G. Lin C.-J. McFadyen I. R. Valletta R. M. Wolter O. Bayer T. Greschner J. Magnetic force microscopy with batch-fabricated force sensors. J. Appl. Phys., 1991, 69(8), 5883-5885.
25. Ohkubo T. Kishigami J. Yanagisawa K. Kaneko R. Sub-micron magnetizing and its detection based on the point magnetic recording concept. IEEE Trans. Magn., 1991, 27(6), 5286-5288.
26. Manne S. Hansma P. K. Massie J. Elings V. B. Gewirth A. A. Atomic-resolution electrochemistry with the atomic force microscope: Copper deposition on gold. Science, 1991, 251, 183-186.
27. Hoh J. H. Cleveland J. P. Prater C. B. Revel J. P. Hansma P. K. Quantized adhesion detected with the atomic force microscope. J. Am. Chem. Soc, 1992, 114, 4917-4918.
28. Hues S. M. Colton R. J. Meyer E. Guntherodt H.-J. Scanning probe microscopy of thin film. MRS Bull., 1993, Jan., 41-49.
29. Weisenhorn A. L. Maivald P. Butt H. J. Hansma P. K. Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscope. Phys. Rev. B., 1992, 45(19), 11226-11232.
30. Kaneko R. Miyamoto T. Hamada E. Development of a controlled friction force microscope and imaging of recording disk surfaces. Adv. Inf. Storage Systems, 1991, 1, 267-277.
31. Meyer G. Amer N. M. Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope. Appl. Phys. Lett., 1990, 57(20), 2089-2091.
32. Ruan J. Bhushan B. Atomic-scale friction measurements using friction force microscopy. Part I舒general principles and new measurement techniques. Trans. ASME, J. Trib., 1994
33. Bhushan B. Ruan J. Atomic-scale friction measurements using friction force microscopy. Part II舒application to magnetic media. Trans. ASME, J. Trib., 1994
34. Ruan J. Bhushan B. Nanoindentation studies of fullerene films using atomic force microscopy. J. Mat. Res., 1993
35. Mate C. M. Lorenz M. R. Novotny V. J. Atomic force microscopy of polymeric liquid films. J. Chem. Phys., 1989, 90(12), 7550-7555.
36. Blackman G. S. Mate C. M. Philpott M. R. Interaction forces of a sharp tungsten tip with molecular films on silicon surface. Phys. Rev. Lett., 1990, 65(18), 2270-2273.
37. Frommer J. Scanning tunneling microscopy and atomic force microscopy in organic chemistry. Angew. Chem. Int. ed. Engl., 1992, 31, 1298-1328.
38. Meyer E. Overney R. Lɒthi R. Brodbeck D. Howald L. Frommer J. Gɒntherodt H.-J. Wolter O. Fujihira M. Takano T. Gotoh Y. Friction force microscopy of mixed Langmuir-Blodgett films. Thin Solid Films, 1992, 220, 132-137.
39. Overney R. M. Meyer E. Frommer J. Brodbeck D. Lɒthi R. Howard L. Gɒntherodt H.-J. Fujihira M. Takano H. Gotoh Y. Friction measurements on phase-separated thin films with a modified atomic force microscope. Nature, 1992, 359, 133-135.
40. O'Shea S. J. Welland M. E. Rayment T. Atomic force microscope study of boundary layer lubrication. Appl. Phys. Lett., 1992, 61(18), 2240-2242.
41. Andoh Y. Oguchi S. Kaneko R. Miyamoto T. Evaluation of very thin lubricant films. J. Phys. D: Appl. Phys., 1992, 25, A71-A75.
42. Majumdar A. Carrejo J. P. Lai J. Thermal imaging using the atomic force microscope. Appl. Phys. Lett., 1993, 62(20), 2501-2503.
43. Burnham N. A. Colton R. J. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope. J. Vac. Sci. Technol. A, 1989, 7(4), 2906-2913.
44. Majumdar A. Oden P. I. Carrejo J. P. Nagahara L. A. Graham J. J. Alexandar J. Nanometer-scale lithography using the atomic force microscope. Appl. Phys. Lett., 1992, 61(19), 2293-2295.
45. Kobayashi A. Grey F. Williams R. S. Ano M. Formation of nanometer-scale grooves in silicon with a scanning tunneling microscope. Science, 1993, 259, 1724-1726.
46. Alexander S. Hellemans L. Marti O. Schneir J. Elings V. Hansma P. K. An atomic-resolution atomic-force microscope implemented using an optical lever. J. Appl. Phys., 1989, 65(1), 164-167.
47. Makinson K. R. On the cause of the frictional difference of the wool fiber. Trans. Faraday Soc, 1948, 44, 279-282.
48. Bowden F. P. Tabor D. The friction and lubrication of solids, 1950, pp. 172-175 (Clarendon Press, Oxford
49. Pharr G. M. Oliver W. C. Clarke D. R. The mechanical behavior of silicon during small-scale indentation. J. Electronic Mater., 1990, 19(9), 881-887.