Outlier process: unifying line processes and robust statistics

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn , Issue , 1994, Pages 15-22

  Black, Michael J ^a   Rangarajan, Anand ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ESTIMATION; IMAGE RECONSTRUCTION; LIGHT; OPTICAL FLOWS; OPTIMIZATION; ROBUSTNESS (CONTROL SYSTEMS); STATISTICAL METHODS;

GROSS MEASUREMENT ERRORS; LINE PROCESS; OUTLIER; ROBUST STATISTICS; SEGMENTATION; SURFACE RECOVERY; UNIFYING LINE PROCESS;

COMPUTER VISION;

EID: 0028096382     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/cvpr.1994.323805     Document Type: Conference Paper

References (12)