Infrared spectra of ultra-thin SiO2 grown on Si surfaces

Materials Research Society Symposium Proceedings

Volumn 318, Issue , 1994, Pages 419-424

  Yamazaki, T ^a   Bjorkman, C H ^a   Fukuda, M ^a   Hirose, M ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); LATTICE VIBRATIONS; PHONONS; SILICA; THIN FILMS;

PHONON MODE; STRETCHING VIBRATION; X RAY PHOTOELECTRON SPECTROSCOPY;

INFRARED SPECTROSCOPY;

EID: 0028060734     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)