Applying a submicron mismatch model to practical IC design

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1994, Pages 297-300

  Guardiani, Carlo ^a   Tomasini, Alfredo ^a   Benkoski, Jacques ^a   Quarantelli, Michele ^a   Gubian, Paolo ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; CORRELATION METHODS; NUMERICAL ANALYSIS; SEMICONDUCTOR DEVICE MODELS; STATISTICAL METHODS; USER INTERFACES;

MISMATCH EFFECT; SUBMICRON MISMATCH MODEL;

INTEGRATED CIRCUIT LAYOUT;

EID: 0028055460     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)