SEM analysis of the nucleation of tin oxide films on glass surfaces

Materials Research Society Symposium Proceedings

Volumn 317, Issue , 1994, Pages 181-186

  Mao, Limin ^a   Benoit, Robert E ^a   Proscia, James W ^a  

^a WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTALLIZATION; DOPING (ADDITIVES); ELECTRIC PROPERTIES; FILM GROWTH; GLASS; MICROSCOPIC EXAMINATION; OXIDES; SUBSTRATES;

FLUORINE DOPED TIN OXIDE; NUCLEATION; NUCLEATION SITES; TIN OXIDE;

TIN COMPOUNDS;

EID: 0028026441     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)