|
Volumn 3, Issue , 1994, Pages 1345-1346
|
Very low noise and low power operation of cryogenic AlInAs/GaInAs/InP HFET's
a a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYOGENIC EQUIPMENT;
ELECTRIC NETWORK PARAMETERS;
ELECTRIC POWER SUPPLIES TO APPARATUS;
ELECTRIC VARIABLES MEASUREMENT;
PERFORMANCE;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR DEVICE MODELS;
SPURIOUS SIGNAL NOISE;
THERMAL EFFECTS;
CRYOGENIC PERFORMANCE;
OPTIMAL NOISE BIAS CONDITION;
FIELD EFFECT TRANSISTORS;
|
EID: 0027990036
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (25)
|
References (9)
|