Analog testability analysis and fault diagnosis using behavioral modeling

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1994, Pages 413-416

  Liu, Edward ^a   Kao, William ^a   Felt, Eric ^a   Sangiovanni Vincentelli, Alberto ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER HARDWARE DESCRIPTION LANGUAGES; DIGITAL TO ANALOG CONVERSION; ELECTRIC FAULT CURRENTS; ELECTRIC NETWORK PARAMETERS; ERROR ANALYSIS; FAILURE ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS; REGRESSION ANALYSIS; SENSITIVITY ANALYSIS;

BEHAVIORAL MODELS; FAULT DIAGNOSIS; SOFTWARE PACKAGE SPICE; SPICE SENSITIVITY ANALYSIS; TESTABILITY ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0027983378     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)