Coplanar on-wafer matching structures tunable by RF-probe position

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1994, Pages 1481-1484

  Schmukler, Bruce C ^a  

^a Watkins Johnson Company   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION; ELECTRIC LINES; ELECTRIC NETWORK SYNTHESIS; FABRICATION; FIELD EFFECT TRANSISTORS; PROBES; SEMICONDUCTOR DEVICE STRUCTURES; TUNING;

COPLANAR ON WAFER MATCHING STRUCTURES;

MICROWAVE DEVICES;

EID: 0027969494     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)