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Volumn 116, Issue 2, 1994, Pages 378-388

Atomic-scale friction measurements using friction force microscopy: Part I-general principles and new measurement techniques

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; FRICTION MOMENT; MEASUREMENT TECHNIQUES; MICROSCOPIC EXAMINATION;

EID: 0027947140     PISSN: 07424787     EISSN: 15288897     Source Type: Journal    
DOI: 10.1115/1.2927240     Document Type: Article
Times cited : (345)

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