-
1
-
-
77952760920
-
Microfabrication of Cantilever Styli for the Atomic Force Microscope
-
Albrecht, T. R., Akamine, S., Carver, T. E., and Quate, C. F., 1990, “Microfabrication of Cantilever Styli for the Atomic Force Microscope,” J. Vac. Sci. and Techol. A, Vol. 8, No. 4, pp. 3386-3396.
-
(1990)
J. Vac. Sci. And Techol. A
, vol.8
, Issue.4
, pp. 3386-3396
-
-
Albrecht, T.R.1
Akamine, S.2
Carver, T.E.3
Quate, C.F.4
-
2
-
-
0026899682
-
Low Temperature Force Microscope with'All-Fiber Interferometer
-
Albrecht, T. R., Grutter, P., Ruger, D. and Smith, D. P. E. 1992, “Low Temperature Force Microscope with'All-Fiber Interferometer,” Ultramicroscopy, Vol. 42-44, pp. 1638-1646.
-
(1992)
Ultramicroscopy
, vol.42-44
, pp. 1638-1646
-
-
Albrecht, T.R.1
Grutter, P.2
Ruger, D.3
Smith, D.P.E.4
-
3
-
-
0000399084
-
Atomic Resolution Imaging of a Nonconductor by Atomic Force Microscopy
-
Albrecht, T. R., and Quate, C. F., 1987, “Atomic Resolution Imaging of a Nonconductor by Atomic Force Microscopy,” J. Appl. Phys., Vol. 62, No. 7, pp. 2599-2602.
-
(1987)
J. Appl. Phys.
, vol.62
, Issue.7
, pp. 2599-2602
-
-
Albrecht, T.R.1
Quate, C.F.2
-
4
-
-
6044229734
-
Molecular Tribology of Ultrathin Liquid Films
-
Van Alsten, J., and Granick, S., 1988, “Molecular Tribology of Ultrathin Liquid Films,” Phys. Rev. Lett., Vol. 61, No. 22, pp. 2570-2573.
-
(1988)
Phys. Rev. Lett.
, vol.61
, Issue.22
, pp. 2570-2573
-
-
Van Alsten, J.1
Granick, S.2
-
6
-
-
85024589676
-
Tribology of Magnetic Head-Medium Interface
-
Dordrecht, Netherlands
-
Bhushan, B., 1993, “Tribology of Magnetic Head-Medium Interface,” in NATO-ASI Volume on High Density Digital Recording, Kluwer Academic Publisher, Dordrecht, Netherlands.
-
(1993)
NATO-ASI Volume on High Density Digital Recording, Kluwer Academic Publisher
-
-
Bhushan, B.1
-
7
-
-
0026187096
-
Atomic Force Microscopy of Magnetic Rigid Disks and Sliders and Its Applications to Tribology
-
Bhushan, B. and Blackman, G. S. 1991, “Atomic Force Microscopy of Magnetic Rigid Disks and Sliders and Its Applications to Tribology,” ASME Journal of Tribology, Vol. 113, pp. 452-457.
-
(1991)
ASME Journal of Tribology
, vol.113
, pp. 452-457
-
-
Bhushan, B.1
Blackman, G.S.2
-
8
-
-
34848919386
-
Surface Studies by Scanning Tunneling Microscopy
-
Binnig, G., Rohrer, H., Gerber, Ch. and Weibel, E., 1982, “Surface Studies by Scanning Tunneling Microscopy,” Phys. Rev. Lett., Vol. 49, No. 1, pp. 5761.
-
(1982)
Phys. Rev. Lett.
, vol.49
, Issue.1
, pp. 5761
-
-
Binnig Rohrer, G.H.1
Gerber, C.H.2
Weibel, E.3
-
9
-
-
0012618901
-
Atomic Force Microscope
-
Binnig, G., Quate, C. F., and Gerber, Ch., 1986, “Atomic Force Microscope,” Phys. Rev. Lett., Vol. 56, No. 9, pp. 930-933.
-
(1986)
Phys. Rev. Lett.
, vol.56
, Issue.9
, pp. 930-933
-
-
Binnig, G.1
Quate, C.F.2
Gerber, C.3
-
10
-
-
0000635852
-
Interaction Forces of a Sharp Tungsten Tip with Molecular Films on Silicon Surfaces
-
Blackman, G. S., Mate, C. M., and Philpott, M. R., 1990, “Interaction Forces of a Sharp Tungsten Tip with Molecular Films on Silicon Surfaces,” Phys. Rev. Lett., Vol. 65, No. 18, pp. 2270-2273.
-
(1990)
Phys. Rev. Lett.
, vol.65
, Issue.18
, pp. 2270-2273
-
-
Blackman, G.S.1
Mate, C.M.2
Philpott, M.R.3
-
11
-
-
84927762517
-
Measuring the Nanomechanical Properties and Surface Forces of Materials Using an Atomic Force Microscope
-
Burnham, N. A. and Colton, R. J., 1989, “Measuring the Nanomechanical Properties and Surface Forces of Materials Using an Atomic Force Microscope,” J. Vac. Sci. Technol. A, Vol. 7, No. 4, pp. 2906-2913.
-
(1989)
J. Vac. Sci. Technol. A
, vol.7
, Issue.4
, pp. 2906-2913
-
-
Burnham, N.A.1
Colton, R.J.2
-
12
-
-
0043255271
-
Atomic Force Microscopy Using Optical Interferometry
-
Erlandsson, R., McClelland, G. M., Mate, C. M., and Chiang, S., 1988, “Atomic Force Microscopy Using Optical Interferometry,” J. Vac. Sci. Technol. A, Vol. 6, No. 2, p. 266-270.
-
(1988)
J. Vac. Sci. Technol. A
, vol.6
, Issue.2
, pp. 266-270
-
-
Erlandsson, R.1
McClelland, G.M.2
Mate, C.M.3
Chiang, S.4
-
13
-
-
33748276762
-
Scanning Tunneling Microscopy and Atomic Force Microscopy in Organic Chemistry
-
Frommer, J., 1992, “Scanning Tunneling Microscopy and Atomic Force Microscopy in Organic Chemistry,” Angew. Chem. Int. Ed. Engl., Vol. 31, pp. 1298-1328.
-
(1992)
Angew. Chem. Int. Ed. Engl
, vol.31
, pp. 1298-1328
-
-
Frommer, J.1
-
14
-
-
84957234200
-
Force Microscope with Capacitive Displacement Detection
-
Goddenhenrich, T., Lemke, H., Hartmann, U., and Heiden, C., 1990, “Force Microscope with Capacitive Displacement Detection,” J. Vac. Sci. Technol. A, Vol. 8, No. 1, pp. 383-387.
-
(1990)
J. Vac. Sci. Technol. A
, vol.8
, Issue.1
, pp. 383-387
-
-
Goddenhenrich, T.1
Lemke, H.2
Hartmann, U.3
Heiden, C.4
-
15
-
-
0000728761
-
Motions and Relaxations of Confined Liquids
-
Granick, S., 1991, “Motions and Relaxations of Confined Liquids,” Science, Vol. 253, pp. 1374-1379.
-
(1991)
Science
, vol.253
, pp. 1374-1379
-
-
Granick, S.1
-
16
-
-
0001100813
-
Magnetic Force Microscopy with Batch-Fabricated Force Sensors
-
Grutter, P., Ruger, D., Mamin, H. J., Castillo, G., Lin, C.-J., McFadyen, I. R., Valletta, R. M., Wolter, O., Bayer, T., and Greschner, J., 1991, “Magnetic Force Microscopy with Batch-Fabricated Force Sensors,” J. Appl. Phys., Vol. 69, No. 8, pp. 5883-5885.
-
(1991)
J. Appl. Phys.
, vol.69
, Issue.8
, pp. 5883-5885
-
-
Grutter, P.1
Ruger Mamin, D.H.J.2
Castillo, G.3
Lin, C.-J.4
McFadyen, I.R.5
Valletta, R.M.6
Wolter, O.7
Bayer, T.8
Greschner, J.9
-
17
-
-
0000516794
-
Atomistic Locking and Friction
-
Hirano, M., and Shinjo, K., 1990, “Atomistic Locking and Friction,” Phys. Rev. B., Vol. 41, No. 17, pp. 11837-11851.
-
(1990)
Phys. Rev. B.
, vol.41
, Issue.17
, pp. 11837-11851
-
-
Hirano, M.1
Shinjo, K.2
-
18
-
-
0000988187
-
Measurement of Force Between Two Mica Surfaces in Aqueous Electrolyte Solutions in the Range 0-100 nm
-
Israelachvili, J. N., and Adams, G. E., 1978, “Measurement of Force Between Two Mica Surfaces in Aqueous Electrolyte Solutions in the Range 0-100 nm,” Chem. Soc. J., Faraday Trans. I, Vol. 74, pp. 975-1001.
-
(1978)
Chem. Soc. J., Faraday Trans. I
, vol.74
, pp. 975-1001
-
-
Israelachvili, J.N.1
Adams, G.E.2
-
19
-
-
0000135554
-
Dynamic Properties of Moleculariy Thin Liquid Films
-
Israelachvili, J. N., McGuiggan, P. M., and Homola, A. M., 1988, “Dynamic Properties of Moleculariy Thin Liquid Films,” Science, Vol. 240, pp. 189-190.
-
(1988)
Science
, vol.240
, pp. 189-190
-
-
Israelachvili, J.N.1
McGuiggan, P.M.2
Homola, A.M.3
-
20
-
-
84986727540
-
A Friction Force Microscope Controlled with an Electromagnet
-
Kaneko, R., 1988, “A Friction Force Microscope Controlled with an Electromagnet,” J. Microscopy, Vol. 152, Pt. 2, pp. 363-369.
-
(1988)
J. Microscopy
, vol.152
, pp. 363-369
-
-
Kaneko, R.1
-
21
-
-
85024537270
-
-
The Jap. Soc. of Tribologists, Tokyo, Japan, Oct
-
Kaneko, R., and Enomoto, Y., (eds.), 1992, Proc. 1st Int. Workshop on Microtribology, The Jap. Soc. of Tribologists, Tokyo, Japan, Oct.
-
(1992)
Proc. 1St Int. Workshop on Microtribology
-
-
Kaneko, R.1
Enomoto, Y.2
-
22
-
-
0004505119
-
Development of a Controlled Friction Force Microscope and Imaging of Recording Disk Surfaces
-
Kaneko R., Miyamoto, T., and Hamada, E., 1991, “Development of a Controlled Friction Force Microscope and Imaging of Recording Disk Surfaces,” Adv. Info. Storage Syst., Vol. 1, pp. 267-277.
-
(1991)
Adv. Info. Storage Syst.
, vol.1
, pp. 267-277
-
-
Kaneko, R.1
Miyamoto, T.2
Hamada, E.3
-
23
-
-
0037845364
-
Ion-Implanted Diamond Tip for a Scanning Tunneling Microscope
-
Kaneko, R., and Oguchi, S., 1990, “Ion-Implanted Diamond Tip for a Scanning Tunneling Microscope,” Jap. J. Appl. Phys., Vol. 28, No. 9, pp. 1854-1855.
-
(1990)
Jap. J. Appl. Phys
, vol.28
, Issue.9
, pp. 1854-1855
-
-
Kaneko, R.1
Oguchi, S.2
-
24
-
-
0026899341
-
Atomic Force Microscope Coupled with an Optical Microscope
-
Kaneko, R., Oguchi, S., Hara, S., Matsuda, R., Okada, T., Ogawa, H., and Nakamura, Y., 1992, “Atomic Force Microscope Coupled with an Optical Microscope,” Ultramicroscopy, Vol. 42-44, pp. 1542-1548.
-
(1992)
Ultramicroscopy
, vol.42-44
, pp. 1542-1548
-
-
Kaneko, R.1
Oguchi, S.2
Hara, S.3
Matsuda, R.4
Okada, T.5
Ogawa, H.6
Nakamura, Y.7
-
25
-
-
0000156345
-
Using Force Modulation to Image Surface Elasticities with the Atomic Force Microscope
-
Maivald, P., Butt, H. J., Gould, S. A. C., Prater, C. B., Drake, B., Gurley, J. A., Elings, V. B., and Hansma, P. K., 1991, “Using Force Modulation to Image Surface Elasticities with the Atomic Force Microscope,” Nanotechnology, Vol. 2, No. 2, pp. 103-106.
-
(1991)
Nanotechnology
, vol.2
, Issue.2
, pp. 103-106
-
-
Maivald, P.1
Butt, H.J.2
Gould, S.A.C.3
Prater, C.B.4
Drake, B.5
Gurley, J.A.6
Elings, V.B.7
Hansma, P.K.8
-
26
-
-
0026035212
-
Atomic-Resolution Electrochemistry with the Atomic Force Microscope: Copper Deposition on Gold
-
Manne, S., Hansma, P. K., Massie, J., Elings, V. B., and Gewirth, A. A., 1991, “Atomic-Resolution Electrochemistry with the Atomic Force Microscope: Copper Deposition on Gold,” Science, Vol. 251, pp. 183-186.
-
(1991)
Science
, vol.251
, pp. 183-186
-
-
Manne, S.1
Hansma, P.K.2
Massie, J.3
Elings, V.B.4
Gewirth, A.A.5
-
27
-
-
0000494380
-
Atomic Force Microscopy of Liquid-Covered Surfaces: Atomic Resolution Images
-
Marti, O., Drake, B., and Hansma, P. K., 1987, “Atomic Force Microscopy of Liquid-Covered Surfaces: Atomic Resolution Images,” Appl. Phys. Lett., Vol. 51, No. 7, pp. 484-486.
-
(1987)
Appl. Phys. Lett.
, vol.51
, Issue.7
, pp. 484-486
-
-
Marti, O.1
Drake, B.2
Hansma, P.K.3
-
28
-
-
4244085510
-
Magnetic Imaging by Force Microscopy with 1000 A Resolution
-
Martin, Y., Wickramasinghe, H. K., 1987, “Magnetic Imaging by Force Microscopy with 1000 A Resolution,” Appl. Phys. Lett., Vol. 50, No. 20, pp. 1455-1457.
-
(1987)
Appl. Phys. Lett.
, vol.50
, Issue.20
, pp. 1455-1457
-
-
Martin, Y.1
Wickramasinghe, H.K.2
-
29
-
-
0343681011
-
Atomic-Scale Friction of a Tungsten Tip on a Graphite Surface
-
Mate, C. M., McClelland, G. M., Erlandsson, R., and Chiang, S., 1987, “Atomic-Scale Friction of a Tungsten Tip on a Graphite Surface,” Phys. Rev. Lett., Vol. 59, No. 17, pp. 1942-1945.
-
(1987)
Phys. Rev. Lett.
, vol.59
, Issue.17
, pp. 1942-1945
-
-
Mate, C.M.1
McClelland, G.M.2
Erlandsson, R.3
Chiang, S.4
-
30
-
-
4143122639
-
Atomic Force Microscopy of Polymeric Liquid Films
-
Mate, C. M., Lorenz, M. R., and Novotny, V. J., 1989, “Atomic Force Microscopy of Polymeric Liquid Films,” J. Chem. Phys. Vol. 90, No. 12, pp. 7550-7555.
-
(1989)
J. Chem. Phys
, vol.90
, Issue.12
, pp. 7550-7555
-
-
Mate, C.M.1
Lorenz, M.R.2
Novotny, V.J.3
-
31
-
-
0003040358
-
The Art and Science and Other Aspects of Making Sharp Tips
-
Melmed, A. J., 1991, “The Art and Science and Other Aspects of Making Sharp Tips,” J. Vac. Sci. Technol. B, Vol. 9, No. 2, pp. 601-608.
-
(1991)
J. Vac. Sci. Technol. B
, vol.9
, Issue.2
, pp. 601-608
-
-
Melmed, A.J.1
-
32
-
-
36549096102
-
Novel Optical Approach to Atomic Force Microscopy
-
Meyer, G., and Amer, N. M., 1988, “Novel Optical Approach to Atomic Force Microscopy,” Appl. Phys. Lett., Vol. 53, No. 12, pp. 1045-1047.
-
(1988)
Appl. Phys. Lett.
, vol.53
, Issue.12
, pp. 1045-1047
-
-
Meyer, G.1
Amer, N.M.2
-
33
-
-
22644441587
-
Optical-Beam-Deflection Atomic Force Microscopy: The NaCl (001) Surface
-
Meyer, G., and Amer, N. M., 1990a, “Optical-Beam-Deflection Atomic Force Microscopy: the NaCl (001) Surface,” Appl. Phys. Lett., Vol. 56, No. 21, pp. 2100-2101.
-
(1990)
Appl. Phys. Lett.
, vol.56
, Issue.21
, pp. 2100-2101
-
-
Meyer, G.1
Amer, N.M.2
-
34
-
-
21544451468
-
Simultaneous Measurement of Lateral and Normal Forces with an Optical-Beam-Deflection Atomic Force Microscope
-
Meyer, G., and Amer, N. M., 1990b, “Simultaneous Measurement of Lateral and Normal Forces with an Optical-Beam-Deflection Atomic Force Microscope,” Appl. Phys. Lett., Vol. 57, No. 20, pp. 2089-2091.
-
(1990)
Appl. Phys. Lett.
, vol.57
, Issue.20
, pp. 2089-2091
-
-
Meyer, G.1
Amer, N.M.2
-
35
-
-
0026944113
-
Friction Force Microscopy of Mixed Langmuir-Blodgett Films
-
Meyer, E., Overney, R., Liithi, R., Brodbeck, D., Howald, L., Frommer, J., Giintherodt, H.-J., Wolter, O., Fujihira, M., Takano, T., and Gotoh, Y., 1992, “Friction Force Microscopy of Mixed Langmuir-Blodgett Films,” Thin Solid Films, Vol. 220, pp. 132-137.
-
(1992)
Thin Solid Films
, vol.220
, pp. 132-137
-
-
Meyer, E.1
Overney, R.2
Liithi, R.3
Brodbeck, D.4
Howald Frommer, L.J.5
Giintherodt, H.-J.6
Wolter, O.7
Fujihira, M.8
Takano, T.9
Gotoh, Y.10
-
36
-
-
33751506293
-
Force Microscopy with a Bidirectional Capacitance Sensor
-
Neubauer, G., Cohen, S. R., McClelland, G. M., Horne, D., and Mate, C. M., 1990, “Force Microscopy with a Bidirectional Capacitance Sensor,” Rev. Sci. Instrum., Vol. 61, No. 9, pp. 2296-2308.
-
(1990)
Rev. Sci. Instrum.
, vol.61
, Issue.9
, pp. 2296-2308
-
-
Neubauer, G.1
Cohen, S.R.2
McClelland, G.M.3
Horne, D.4
Mate, C.M.5
-
37
-
-
0026255424
-
Submicron Magnetizing and Its Detection Based on the Point Magnetic Recording Concept
-
Ohkubo, T., Kishigami, J., Yanagisawa, K., and Kaneko, R., 1991, “Submicron Magnetizing and Its Detection Based on the Point Magnetic Recording Concept,” IEEE Trans. Magn., Vol. 27, No. 6, pp. 5286-5288.
-
(1991)
IEEE Trans. Magn.
, vol.27
, Issue.6
, pp. 5286-5288
-
-
Ohkubo, T.1
Kishigami, J.2
Yanagisawa, K.3
Kaneko, R.4
-
38
-
-
0001150506
-
Atomic Force Microscope Study of Boundary Layer Lubrication
-
O’Shea, S. J., Welland, M. E., and Rayment, T., 1992, “Atomic Force Microscope Study of Boundary Layer Lubrication,” Appl. Phys. Lett., Vol. 61, No. 18, pp. 2240-2242.
-
(1992)
Appl. Phys. Lett.
, vol.61
, Issue.18
, pp. 2240-2242
-
-
O’shea, S.J.1
Welland, M.E.2
Rayment, T.3
-
39
-
-
0026925734
-
Friction Measurements on Phase-Separated Thin Films with a Modified Atomic Force Microscope
-
Overney, R. M., Meyer, E., Frommer, J., Brodbeck, D., Liithi, R., Howard, L., Giintherodt, H.-J., Fujihira, M., Takano, H., and Gotoh, Y., 1992, “Friction Measurements on Phase-Separated Thin Films with a Modified Atomic Force Microscope,” Nature, Vol. 359, pp. 133-135.
-
(1992)
Nature
, vol.359
, pp. 133-135
-
-
Overney, R.M.1
Meyer, E.2
Frommer, J.3
Brodbeck, D.4
Liithi, R.5
Howard, L.6
Giintherodt, H.-J.7
Fujihira, M.8
Takano, H.9
Gotoh, Y.10
-
40
-
-
0027797526
-
Nanoindentation Studies of Sublimed Fullerene Films Using Atomic Force Microscopy
-
press
-
Ruan, J., and Bhushan, B., 1993, “Nanoindentation Studies of Sublimed Fullerene Films Using Atomic Force Microscopy,” J. Mater. Res., (in press).
-
(1993)
J. Mater. Res
-
-
Ruan, J.1
Bhushan, B.2
-
41
-
-
26044432476
-
Improved Fiber-Optical Interferometer for Atomic Force Microscopy
-
Ruger, D., Mamin, H. J., and Guethner, P., 1989, “Improved Fiber-Optical Interferometer for Atomic Force Microscopy,” Appl. Phys. Lett., Vol. 55, No. 25, pp. 2588-2590.
-
(1989)
Appl. Phys. Lett
, vol.55
, Issue.25
, pp. 2588-2590
-
-
Ruger, D.1
Mamin, H.J.2
Guethner, P.3
-
42
-
-
0001095049
-
Review of Scanning Force Microscopy
-
Sarid, D., and Elings, V., 1991, “Review of Scanning Force Microscopy,” J. Vac. Sci. Technol. B, Vol. 9, No. 2, pp. 431-437.
-
(1991)
J. Vac. Sci. Technol. B
, vol.9
, Issue.2
, pp. 431-437
-
-
Sarid, D.1
Elings, V.2
-
43
-
-
0000031184
-
Compact Scanning-Force Microscope Using Laser Diode
-
Sarid, D., lams, D., Weissenberger, V., and Bell, L. S., 1988, “Compact Scanning-Force Microscope Using Laser Diode,” Optics Letters, Vol. 13, No. 12, pp. 1057-1059.
-
(1988)
Optics Letters
, vol.13
, Issue.12
, pp. 1057-1059
-
-
Sarid, D.1
Lams, D.2
Weissenberger, V.3
Bell, L.S.4
-
44
-
-
0001258053
-
Understanding Magnetic Force Microscopy
-
(Germany)
-
Schonenberger, C., and Alvarado, S. F., 1990, “Understanding Magnetic Force Microscopy,” Z. Phys. B. (Germany), Vol. 80, No. 3, pp. 373-83.
-
(1990)
Z. Phys. B
, vol.80
, Issue.3
, pp. 373-383
-
-
Schonenberger, C.1
Alvarado, S.R.2
|