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Volumn 70, Issue 6, 1993, Pages 845-848

Field-induced charge-density-wave deformations and phase slip in NbSe3

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL IMPURITIES; DIFFRACTOMETERS; ELASTICITY; ELECTRIC CHARGE MEASUREMENT; ELECTRIC FIELD EFFECTS; NIOBIUM ALLOYS; SELENIUM COMPOUNDS; THERMAL EFFECTS; VECTORS; X RAY ANALYSIS;

EID: 0027911654     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.70.845     Document Type: Article
Times cited : (58)

References (28)
  • 1
    • 84927484287 scopus 로고    scopus 로고
    • For comprehensive reviews of CDWs, see P. Monceau, in Electronic Properties of Quasi-One-Dimensional Materials (Reidel, Dordrecht, 1985), Pt. II, p. 139;
  • 7
    • 84927458787 scopus 로고    scopus 로고
    • For a comprehensive review of previous work on CDW phase slip, see F. Ya. Nad', in Charge Density Waves in Solids, edited by L. P. Gor'kov and G. Grüner (Elsevier, Amsterdam, 1989), p. 189.
  • 9
    • 84927505132 scopus 로고    scopus 로고
    • The diffractometer was run in a mode which kept astar and bstar in the scattering plane.
  • 10
    • 84927464188 scopus 로고    scopus 로고
    • The precise origin of the observed broadenings is unclear. Possible mechanisms include the following: the beam sampling regions of the sample where the wave vector is different; inhomogenous CDW current due to sample thickness variations; and inhomogenous CDW current due to field fringing at contacts.
  • 11
    • 84927476906 scopus 로고    scopus 로고
    • Low-resolution scans indicate that the integrated peak intensity is independent of I.
  • 12
    • 84927501655 scopus 로고    scopus 로고
    • Our sensitivity to peak position shifts is app 3 times 10-5 A ang sup -1_, which is app 10% of the line width (FWHM).
  • 13
    • 0000516412 scopus 로고
    • observed changes in the length of TaS3 crystals when the CDW was depinned. The changes they observed correspond to (020) shifts of app 4 times 10-6 A ang sup -1_, which were not resolvable in our experiment.
    • (1992) Phys. Rev. B , vol.46 , pp. 1874
    • Hoen, S.1    Burk, B.2    Zettl, A.3    Inui, M.4
  • 14
    • 84927463736 scopus 로고    scopus 로고
    • Because of the finite current contact widths, the uncertainty in the position of the midpoint between contacts is approximately 0.5 mm.
  • 27
    • 84927479167 scopus 로고    scopus 로고
    • If the effects of field fringing near the contacts is included, the Kz estimate is reduced by roughly a factor of 2. See S. Ramakrishna et al. (to be published).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.