Temperature dependence of penetration depth and surface resistance of Nd1.85Ce0.15CuO4

Physical Review Letters

Volumn 70, Issue 1, 1993, Pages 85-88

  Wu, Dong Ho ^a   Mao, Jian ^a   Mao, S N ^a   Peng, J L ^a   Xi, X X ^a   Venkatesan, T ^a   Greene, R L ^a   Anlage, Steven M ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COPPER OXIDES; CRYSTALS; ELECTRIC IMPEDANCE MEASUREMENT; ENERGY GAP; MICROWAVE MEASUREMENT; SUPERCONDUCTING FILMS; SUPERCONDUCTING TRANSITION TEMPERATURE;

IN-PLANE PENETRATION DEPTH; N-TYPE CUPRATE SUPERCONDUCTORS; S-WAVE BSC THEORY; SURFACE RESISTANCE;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0027908219     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.70.85     Document Type: Article

References (23)