Temperature stability of cobalt Schottky contacts on n- and p-type 6H silicon carbide

Applied Surface Science

Volumn 73, Issue C, 1993, Pages 316-321

  Lundberg, N ^a   Zetterling, C M ^a   Ostling M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; HEAT RESISTANCE; SCHOTTKY BARRIER DIODES; SILICON CARBIDE; STABILITY;

COBALT SCHOTTKY CONTACTS; COBALT SILICIDES; TEMPERATURE STABILITY;

REFRACTORY MATERIALS;

EID: 0027906661     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(93)90186-F     Document Type: Article

References (10)

1. The nuclear resonance at 4.26 MeV and its application in RBS analysis of carbon content in thin films