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Volumn 12, Issue 4, 1993, Pages 221-230

A comparison of energy balance and simplified hydrodynamic models for gaas simulation

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC CURRENTS; ELECTRON TRANSPORT PROPERTIES; ERROR ANALYSIS; HYDRODYNAMICS; IONIZATION; MONTE CARLO METHODS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MODELS; THERMAL GRADIENTS;

EID: 0027885973     PISSN: 03321649     EISSN: None     Source Type: Journal    
DOI: 10.1108/eb051801     Document Type: Review
Times cited : (7)

References (7)
  • 1
    • 36149018649 scopus 로고
    • Diffusion of Hot and Cold Electrons in Semiconductor Barriers
    • R. Stratton, “Diffusion of Hot and Cold Electrons in Semiconductor Barriers,” phys. Rev Vol. 126, 1962, pp. 2002–2013.
    • (1962) phys. Rev , vol.126 , pp. 2002-2013
    • Stratton, R.1
  • 2
    • 0014705867 scopus 로고
    • Transport Equations for Two-Valley Semiconductors
    • K. Blotekjaer, ‘Transport Equations for Two-Valley Semiconductors IEEE Trans„ Vol. ED-17, 1970, pp. 38–47.
    • (1970) IEEE Trans , vol.ED-17 , pp. 38-47
    • Blotekjaer, K.1
  • 3
    • 0024704148 scopus 로고
    • An Assesment of Approximate Nonstationary Charge Transport Models Used for GaAs Device Modeling
    • P. Sandborn A. Rao and P. Blakey, “An Assesment of Approximate Nonstationary Charge Transport Models Used for GaAs Device Modeling,” IEEE Trans. Vol. ED-36, 1989, pp. 1244–1253.
    • (1989) IEEE Trans. , vol.ED-36 , pp. 1244-1253
    • Sandborn, P.1    Rao, A.2    Blakey, P.3
  • 4
    • 0026735256 scopus 로고
    • An Improved Energy Transport Model Including Nonparabolicity and Non-Maxwellian Distribution Effects
    • D. Chen, E.G. Kan, U. Ravaioli, C.W. Shu, and R. W. Dutton, An Improved Energy Transport Model Including Nonparabolicity and Non-Maxwellian Distribution Effects,” IEEE Elect. Dev. Lett. Vol. 13, 1992, pp. 26–28.
    • (1992) IEEE Elect. Dev. Lett. , vol.13 , pp. 26-28
    • Chen, D.1    Kan, E.G.2    Ravaioli, U.3    Shu, C.W.4    Dutton, R.W.5
  • 7
    • 0025457187 scopus 로고
    • Monte Carlo Analysis of Semiconductor Devices
    • S. Laux, M. Fischetti, and D. Frank, ‘Monte Carlo Analysis of Semiconductor Devices: the DAMOCLES program* IBM J Research and Development Vol.34, 4, 1990, pp. 466–494.
    • (1990) IBM J Research and Development , vol.34 , Issue.4 , pp. 466-494
    • Laux, S.1    Fischetti, M.2    Frank, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.