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Volumn , Issue , 1993, Pages 478-487
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Realizing a high measure of confidence for defect level analysis of random testing
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
DEFECTS;
ERROR ANALYSIS;
MATHEMATICAL MODELS;
MONTE CARLO METHODS;
NUMERICAL ANALYSIS;
PROBABILITY;
RANDOM PROCESSES;
CONFIDENCE DEGREE;
DEFECT LEVEL ANALYSIS;
PROBABILITY DISTRIBUTION;
RANDOM TESTING;
INTEGRATED CIRCUIT TESTING;
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EID: 0027881218
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (15)
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