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Volumn 62, Issue 1-3, 1993, Pages 510-516
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Friction and measurement of friction on a nanometer scale
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL ANALYSIS;
INDIUM;
MICROSCOPES;
NUMERICAL ANALYSIS;
SILICON COMPOUNDS;
TRIBOLOGY;
CHEMICAL SENSITIVITY;
FRICTION MICROSCOPES;
NANOMETER SCALES;
FRICTION;
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EID: 0027877957
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/0257-8972(93)90292-V Document Type: Article |
Times cited : (12)
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References (23)
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