Self-Calibration Techniques for a Second-Order Multibit Sigma—Delta Modulator

IEEE Journal of Solid-State Circuits

Volumn 28, Issue 12, 1993, Pages 1216-1223

  Fattaruso, John W ^a   Kiriaki, Sarni ^a   Wit, Michiel De ^a   Warwar, Greg ^b  

^a TEXAS INSTRUMENTS   (United States)

^b Vitesse Semiconductor Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; INTEGRATED CIRCUITS; SOLID STATE DEVICES;

HARMONIC DISTORTION; OVERSAMPLED MODULATORS; QUANTIZATION NOISE;

DIGITAL TO ANALOG CONVERSION;

EID: 0027876242     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.261995     Document Type: Article

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