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Volumn , Issue , 1993, Pages 123-125
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New compact wideband balun
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
DESIGN;
INTEGRATED CIRCUIT TESTING;
SEMICONDUCTOR DEVICES;
INSERTION LOSS;
MICROSTRIP CONFIGURATION;
MONOLITHIC MICROMETER INTEGRATED CIRCUITS;
WIDEBAND BALUN;
MONOLITHIC INTEGRATED CIRCUITS;
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EID: 0027873208
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (45)
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References (5)
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