SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 236, Issue 1-2, 1993, Pages 204-208

Investigation of the adhesion mechanisms of silicon alloy thin films on polymer substrates by IR ellipsometry

(3) Drevillon B a Rostaing, J C b Vallon, S a

a LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES (France)

b AIR LIQUIDE (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ACTIVATION; DEPOSITION; ELLIPSOMETRY; INFRARED INSTRUMENTS; INTERFACES (MATERIALS); PLASMA APPLICATIONS; POLYCARBONATES; SILICON ALLOYS; SURFACE PHENOMENA; SURFACE TREATMENT; THIN FILMS; VIBRATIONS (MECHANICAL);

ADHESION MECHANISM; CARBON NITROGEN BOND; FOURIER TRANSFORM SPECTROSCOPY; INFRARED ELLIPSOMETER; PHOTOELASTIC DEVICE;

ADHESION;

EID: 0027871977 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/0040-6090(93)90670-K Document Type: Article

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.