Fault dictionary compression and equivalence class computation for sequential circuits

Volumn , Issue , 1993, Pages 508-511

  Ryan, Paul G ^a   Fuchs, W Kent ^a   Pomeranz, Irith ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; DATA COMPRESSION; DEFECTS; ELECTRIC FAULT LOCATION; EQUIVALENCE CLASSES; ERROR ANALYSIS; VECTORS; VLSI CIRCUITS;

EQUIVALENCE CLASS COMPUTATION; FAULT DICTIONARY;

SEQUENTIAL CIRCUITS;

EID: 0027868460     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)