메뉴 건너뛰기




Volumn 40, Issue 12, 1993, Pages 2186-2191

Light-Induced Sidegating Effect in GaAs MESFET's

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRON TRANSPORT PROPERTIES; GATES (TRANSISTOR); INTERFACES (MATERIALS); ION IMPLANTATION; IONIC CONDUCTION; IONIZATION OF SOLIDS; LIGHT; MATHEMATICAL MODELS; PHOTOSENSITIVITY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0027850145     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.249463     Document Type: Article
Times cited : (6)

References (15)
  • 1
    • 0020116930 scopus 로고
    • Carrier injection and backgating effect in GaAs MESFET's
    • Apr.
    • C. P. Lee, S. J. Lee, and B. M. Welch, “Carrier injection and backgating effect in GaAs MESFET's IEEE Electron Dev. Lett., vol. 3, pp. 97-98. Apr. 1982.
    • (1982) IEEE Electron Dev. Lett. , vol.3 , pp. 97-98
    • Lee, C.P.1    Lee, S.J.2    Welch, B.M.3
  • 2
    • 0025475720 scopus 로고
    • Inclusion of impact ionization in the backgating of GaAs FET's
    • Aug.
    • Z.-M. Li, D. J. Day, S. P. McAlister, and C. M. Hurd, “Inclusion of impact ionization in the backgating of GaAs FET's IEEE Electron Dev. Lett., vol. 11, pp. 342–345, Aug. 1990.
    • (1990) IEEE Electron Dev. Lett. , vol.11 , pp. 342-345
    • Li, Z.-M.1    Day, D.J.2    McAlister, S.P.3    Hurd, C.M.4
  • 3
    • 21544462911 scopus 로고
    • Influence of metal structure on sidegating properties in GaAs LSIs
    • K. Inokuchi, Y. S. Itoh, and Y. Sano, “Influence of metal structure on sidegating properties in GaAs LSIs,” J. Electrochem. Soc., vol. 137, no. 9, p. 464C, 1990.
    • (1990) J. Electrochem. Soc , vol.137 , Issue.9 , pp. 464C
    • Inokuchi, K.1    Itoh, Y.S.2    Sano, Y.3
  • 4
    • 0027574666 scopus 로고
    • Numerical simulation of sidegating effect in GaAs MESFET's
    • Apr.
    • S. J. Chang and C. P. Lee, “Numerical simulation of sidegating effect in GaAs MESFET's IEEE Trans. Electron Devices, vol. 40, p. 698, Apr. 1993.
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 698
    • Chang, S.J.1    Lee, C.P.2
  • 5
    • 0026835263 scopus 로고
    • Schottky contact effects in the sidegating effect of GaAs devices
    • Y. Liu, R. W. Dutton, and M. D. Deal, “Schottky contact effects in the sidegating effect of GaAs devices,” IEEE Electron Dev. Lett., vol. 13, p. 149, 1992.
    • (1992) IEEE Electron Dev. Lett. , vol.13 , pp. 149
    • Liu, Y.1    Dutton, R.W.2    Deal, M.D.3
  • 6
    • 0026938281 scopus 로고
    • Comments on Schottky contact effects in the sidegating effect of GaAs Devices
    • S. G. Ayyar, “Comments on Schottky contact effects in the sidegating effect of GaAs Devices,” IEEE Electron Dev. Lett., vol. 13, p. 547, 1992.
    • (1992) IEEE Electron Dev. Lett. , vol.13 , pp. 547
    • Ayyar, S.G.1
  • 7
    • 84941870829 scopus 로고    scopus 로고
    • Numerical simulation of and temperature dependence of sidegating effect in GaAs MESFET's
    • to be published.
    • S.J. Chang and C. P. Lee, “Numerical simulation of and temperature dependence of sidegating effect in GaAs MESFET's,” Solid-State Electron, to be published.
    • Solid-State Electron
    • Chang, S.J.1    Lee, C.P.2
  • 8
    • 0026910958 scopus 로고
    • Numerical simulation of the hysteresis in the sidegating effect in GaAs MESFET's—The effect of Schottky contacts
    • Aug.
    • S.J. Chang and C. P. Lee, “Numerical simulation of the hysteresis in the sidegating effect in GaAs MESFET's—The effect of Schottky contacts,” IEEE Electron Dev. Lett., vol. 13, pp. 436–438, Aug. 1992.
    • (1992) IEEE Electron Dev. Lett. , vol.13 , pp. 436-438
    • Chang, S.J.1    Lee, C.P.2
  • 9
    • 0027675727 scopus 로고
    • Numerical simulation of the suppression of sidegating effect in GaAs MESFET's by ion bombardment
    • S.J. Chang and C. P. Lee, “Numerical simulation of the suppression of sidegating effect in GaAs MESFET's by ion bombardment,” Solid-State Electron, 1993.
    • (1993) Solid-State Electron
    • Chang, S.J.1    Lee, C.P.2
  • 10
    • 0020293371 scopus 로고
    • Effect of substrate conduction and backgating on the performance of GaAs integrated circuits
    • C. P. Lee, R. Vahrenkamp, S. J. Lee, V. D. Shen, and B. M. Welch, “Effect of substrate conduction and backgating on the performance of GaAs integrated circuits,” in GaAs IC Symp. Tech. Dig., 1982, pp. 169–172.
    • (1982) GaAs IC Symp. Tech. Dig , pp. 169-172
    • Lee, C.P.1    Vahrenkamp, R.2    Lee, S.J.3    Shen, V.D.4    Welch, B.M.5
  • 13
    • 0025477975 scopus 로고
    • Two-dimensional numerical simulation of sidegating effect in GaAs MESFET's
    • N. Goto, Y. Ohno, and H. Yano, “Two-dimensional numerical simulation of sidegating effect in GaAs MESFET's,” IEEE Trans. Electron Devices, vol. 37, pp. 1821–1827, 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 1821-1827
    • Goto, N.1    Ohno, Y.2    Yano, H.3
  • 14
    • 0026896420 scopus 로고
    • Numerical analysis of the photoeffects in GaAs MESFET's
    • S. H. Lo and C. P. Lee, “Numerical analysis of the photoeffects in GaAs MESFET's,” IEEE Trans. Electron Devices, vol. 39, pp. 1564–1570, 1992.
    • (1992) IEEE Trans. Electron Devices , vol.39 , pp. 1564-1570
    • Lo, S.H.1    Lee, C.P.2
  • 15
    • 0009526726 scopus 로고
    • Mechanism of electrostatic potential conduction in semi-insulating substrates
    • Y. Ohno and N. Goto, “Mechanism of electrostatic potential conduction in semi-insulating substrates J. Appl. Phys., vol. 66, pp. 1217–1221, 1989.
    • (1989) J. Appl. Phys. , vol.66 , pp. 1217-1221
    • Ohno, Y.1    Goto, N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.