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Volumn 6, Issue 12, 1993, Pages 850-857
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Study of the crystallization process in Bi2-xPb xSr2Ca2Cu3O10-y glass systems: Optical polarized light microscopy, electrical and magnetic properties
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Author keywords
[No Author keywords available]
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Indexed keywords
GLASS RECRYSTALLIZATION ROUTE TECHNIQUE;
HIGH RESOLUTION POLARIZATION MICROGRAPHS;
MAGNETIC SUSCEPTIBILITY MEASUREMENT;
OPTICAL POLARIZED LIGHT MICROSCOPY;
PHASE STABILITY;
REPRECIPITATION;
SPLAT QUENCHING;
CRYSTAL MICROSTRUCTURE;
CRYSTALLIZATION;
ELECTRIC PROPERTIES;
ELECTRIC VARIABLES MEASUREMENT;
GLASS;
MAGNETIC PROPERTIES;
MAGNETIC VARIABLES MEASUREMENT;
MICROSCOPIC EXAMINATION;
PHASE TRANSITIONS;
QUENCHING;
STABILITY;
SYNTHESIS (CHEMICAL);
HIGH TEMPERATURE SUPERCONDUCTORS;
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EID: 0027849483
PISSN: 09532048
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-2048/6/12/008 Document Type: Article |
Times cited : (10)
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References (24)
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