Distance metric between 3D models and 2D images for recognition and classification

IEEE Computer Vision and Pattern Recognition

Volumn , Issue , 1993, Pages 220-225

  Weinshall, D ^a   Basri, R ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFICATION (OF INFORMATION); COMPUTER VISION; DISTANCE MEASUREMENT; IMAGE ANALYSIS; MATHEMATICAL MODELS; MATHEMATICAL TECHNIQUES;

AFFINE DEFORMATIONS; DISTANCE METRIC; OBJECT RECOGNITION; TRANSFORMATION METRIC; TWO D IMAGES;

IMAGE PROCESSING;

EID: 0027849252     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)