Analysis of HBM ESD testers and specifications using a 4th order lumped element model

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1993, Pages 129-137

  Verhaege, Koen ^a   Roussel, Philippe J ^a   Groeseneken, Guido ^a   Maes, Herman E ^a   Gieser, Horst ^a   Russ, Christian ^a   Egger, Peter ^a   Guggenmos, Xaver ^a   Kuper, Fred G ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; CURVE FITTING; ELECTRIC DISCHARGES; ELECTRIC NETWORK PARAMETERS; LUMPED PARAMETER NETWORKS; SELECTION; STANDARDS;

ELECTRIC OVERSTRESS; FOURTH ORDER LUMPED ELEMENT MODEL; HBM ELECTROSTATIC DISCHARGE TESTERS; PARASITIC ELEMENTS;

ELECTRONIC EQUIPMENT;

EID: 0027844313     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)