ESD protection capability of SOI snapback NMOSFETS: mechanisms and failure modes

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1993, Pages 215-219

  Verhaege, Koen ^a   Groeseneken, Guido ^a   Colinge, Jean Pierre ^a   Maes, Herman E ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRIC EQUIPMENT PROTECTION; FAILURE ANALYSIS; GATES (TRANSISTOR); OVERCURRENT PROTECTION; OVERVOLTAGE PROTECTION; PERFORMANCE; SILICON ON INSULATOR TECHNOLOGY;

CLAMPING DEVICE; ELECTROSTATIC DISCHARGE PROTECTION; FAILURE MODES; GATE LENGTH; GATE OXIDE; SIMOX WAFERS; SNAPBACK NMOSFETS;

MOSFET DEVICES;

EID: 0027836961     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)