Delay testing for non-robust untestable circuits

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 954-961

  Cheng, Kwang Ting ^a   Chen, Hsi Chuan ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; ELECTRIC FAULT LOCATION; ELECTRIC NETWORK ANALYSIS; REDUNDANCY; ROBUSTNESS (CONTROL SYSTEMS);

DELAY TESTING; ISCAS85 BENCHMARK CIRCUITS; NON ROBUST UNTESTABLE CIRCUITS; REDUNDANT PATH DELAY FAULTS;

COMBINATORIAL CIRCUITS;

EID: 0027833796     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)