iDD pulse response testing of analog and digital CMOS circuits

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 626-634

  Beasley, J S ^a   Ramamurthy, H ^a   Ramirez Angulo, J ^a   DeYong, M ^a  

^a NEW MEXICO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; DIGITAL INTEGRATED CIRCUITS; ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT MANUFACTURE;

POWER SUPPLY RAILS; PULSE RESPONSE TESTING; TRANSIENT RAIL CURRENTS;

INTEGRATED CIRCUIT TESTING;

EID: 0027833787     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)