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Volumn , Issue , 1993, Pages 627-630
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A 0.6 µm2 256Mb Trench DRAM Cell with Self-Aligned Buried Strap (BEST)
a a a a a a a a a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DYNAMIC RANDOM ACCESS STORAGE;
INTEGRATED CIRCUIT DESIGN;
CELLULAR ARRAYS;
ELECTRIC CONNECTORS;
ETCHING;
SEMICONDUCTOR DEVICE MANUFACTURE;
SUBSTRATES;
BIT LINES;
BURIED STRAPS;
DESIGN RULES;
DRAM CELLS;
SELF-ALIGNED;
SIMPLE++;
SMALL CELLS;
TEST CHIPS;
UNIQUE FEATURES;
PHOTOLITHOGRAPHY;
RANDOM ACCESS STORAGE;
FOLDED BITLINE CELL;
MERGED ISOLATION AND NODE TRENCH (MINT);
TRENCH CELL;
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EID: 0027814761
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (39)
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References (7)
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