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Volumn 40, Issue 6, 1993, Pages 1845-1852

Single Event Phenomena in Atmospheric Neutron Environments

Author keywords

[No Author keywords available]

Indexed keywords

AIRCRAFT; COSMIC RAYS; DETECTORS; EARTH ATMOSPHERE; ELECTRIC CHARGE MEASUREMENT; MATHEMATICAL MODELS; PARTICLE BEAMS; RANDOM ACCESS STORAGE; SILICON; SPACE FLIGHT;

EID: 0027812596     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273471     Document Type: Article
Times cited : (61)

References (17)
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  • 7
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    • Neutron–Induced Single Event Upsets in Static RAMS Observed at 10KM Flight Altitude
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  • 8
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    • Single Event Upset in Avionics
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    • Taber, A.1    Normand, E.2
  • 11
    • 0021582517 scopus 로고
    • Neutron Generated Single–Event Upsets in the Atmosphere
    • R. Silberberg, C.H. Tsao, and J.R. Letaw, “Neutron Generated Single–Event Upsets in the Atmosphere”, IEEE Trans. Nucl. Sci., NS-31, 1183–1185, 1984.
    • (1984) IEEE Trans. Nucl. Sci , vol.NS-31 , pp. 1183-1185
    • Silberberg, R.1    Tsao, C.H.2    Letaw, J.R.3
  • 12
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    • A Comparison of Neutron–Induced SEU Rates in Si and GaAs Devices
    • C.H. Tsao, R. Silberberg, and J.R. Letaw, “A Comparison of Neutron–Induced SEU Rates in Si and GaAs Devices”, IEEE Trans. Nucl Sci., NS-35, 1634–1637, 1988.
    • (1988) IEEE Trans. Nucl Sci , vol.NS-35 , pp. 1634-1637
    • Tsao, C.H.1    Silberberg, R.2    Letaw, J.R.3
  • 13
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    • Guidelines for Predicting Single–Event Event Upsets in Neutron Environments
    • J.R. Letaw and E. Normand, “Guidelines for Predicting Single–Event Event Upsets in Neutron Environments”, IEEE Trans. Nucl. Sci., Vol. 38, 1500–1506, 1991.
    • (1991) IEEE Trans. Nucl. Sci , vol.38 , pp. 1500-1506
    • Letaw, J.R.1    Normand, E.2
  • 14
    • 0025660048 scopus 로고
    • Estimation of Proton Upset Rates from Heavy Ion Test Data
    • J.G. Rollins, “Estimation of Proton Upset Rates from Heavy Ion Test Data”, IEEE Trans. Nucl. Sci., Vol. 37, 1961–1965, 1990.
    • (1990) IEEE Trans. Nucl. Sci , vol.37 , pp. 1961-1965
    • Rollins, J.G.1
  • 15
    • 0026400769 scopus 로고
    • Determination of SEU Parameters of NMOS and CMOS SRAMs
    • P.J. McNulty, W.J. Beauvais, and D.R. Roth, “Determination of SEU Parameters of NMOS and CMOS SRAMs”, IEEE Trans. Nucl. Sci., Vol 38, 1463–1470, 1991.
    • (1991) IEEE Trans. Nucl. Sci , vol.38 , pp. 1463-1470
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  • 16
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    • Charge Collection by Drift During Single Particle Upset
    • M. Shur, “Charge Collection by Drift During Single Particle Upset”, IEEE Trans. Nucl. Sci., NS-33, 1140–1146, 1986.
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    • Shur, M.1
  • 17
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    • Revised Funnel Calculations for Heavy Particles with High dE/dx
    • T.R. Oldham, F.B. McLean, and J.M. Hartman, “Revised Funnel Calculations for Heavy Particles with High dE/dx”, IEEE Trans. Nucl. Sci., NS-33, 1646–1650, 1986.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.