Experimental Evidence of Two Species of Radiation Induced Trapped Positive Charge

IEEE Transactions on Nuclear Science

Volumn 40, Issue 6, 1993, Pages 1316-1322

  Freitag, R K ^a   Brown, D B ^a   Dozier, C M ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHARGE CARRIERS; DEFECTS; ELECTRON TRANSPORT PROPERTIES; ELECTRON TUNNELING; GATES (TRANSISTOR); INTERFACES (MATERIALS); OXIDES; RADIATION EFFECTS; SEMICONDUCTOR DEVICE MODELS;

ANOMALOUS POSITIVE CHARGE; FOWLER-NORDHEIM TUNNELING; OXIDE FIELD; RADIATION INDUCED TRAPPED POSITIVE CHARGE;

MOSFET DEVICES;

EID: 0027809459     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273536     Document Type: Article

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