Effect of thermal shunt on the current instability of multiple-emitter-finger heterojunction bipolar transistors

Proceedings of the 1993 Bipolar/Bicoms Circuits and Technology

Volumn , Issue , 1993, Pages 253-256

  Liou, L L ^a   Bayraktaroglu, B ^a   Huang, C I ^a   Barrette, J ^a  

^a WRIGHT PATTERSON AIR FORCE BASE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; EQUIVALENT CIRCUITS; GATES (TRANSISTOR); HETEROJUNCTIONS; SEMICONDUCTOR DEVICE MODELS; SYSTEM STABILITY; THERMAL EFFECTS;

CURRENT INSTABILITY; MULTIPLE EMITTER FINGER HETEROJUNCTION BIPOLAR TRANSISTORS; THERMAL SHUNT EFFECTS;

BIPOLAR TRANSISTORS;

EID: 0027808586     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/bipol.1993.617510     Document Type: Conference Paper

References (8)