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Volumn 3, Issue , 1993, Pages 2429-2431
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Field-based technique for the longitudinal profiling of ultrarelativistic electron or positron bunches down to lengths of ≤ 10 microns
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC MATERIALS;
LASER PULSES;
MATHEMATICAL MODELS;
MECHANICAL VARIABLES MEASUREMENT;
PARTICLE ACCELERATORS;
REFRACTIVE INDEX;
STREAK CAMERAS;
FIELD BASED TECHNIQUE;
LONGITUDINAL PROFILING;
POSITRON BUNCHES;
ULTRARELATIVISTIC ELECTRON BUNCHES;
STORAGE RINGS;
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EID: 0027807398
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (12)
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