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Volumn 3, Issue , 1993, Pages 2429-2431

Field-based technique for the longitudinal profiling of ultrarelativistic electron or positron bunches down to lengths of ≤ 10 microns

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LASER PULSES; MATHEMATICAL MODELS; MECHANICAL VARIABLES MEASUREMENT; PARTICLE ACCELERATORS; REFRACTIVE INDEX; STREAK CAMERAS;

EID: 0027807398     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (12)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.